A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer

• Main Author: Muller, David Eugene
• Format: Others
• Published: 1951
• Online Access: https://thesis.library.caltech.edu/10476/2/Muller_DE_1951.pdf; Muller, David Eugene (1951) A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/SB6A-0Z19. https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639 <https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639>

<p>Precision determinations of gamma ray and x-ray wavelengths in the spectra following decay of iridium 192 and tungsten 187 are recorded. Measurements of these wavelengths were made with the focusing crystal diffraction spectrometer.</p> <p>Development of a scintillation counter for use as a gamma ray detector in the spectrometer is described.</p> <p>The precision of measurements with spectrometer is analyzed; particular attention being paid to errors resulting from statistical variations in counting rate. Linearity of the instrument is studied by comparing measurements obtained with first, second and third order reflections in the crystal.</p> <p>Gamma ray energies are combined so as to form decay schemes for iridium 192 and tungsten 187.</p>