A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer

A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer

<p>Precision determinations of gamma ray and x-ray wavelengths in the spectra following decay of iridium 192 and tungsten 187 are recorded. Measurements of these wavelengths were made with the focusing crystal diffraction spectrometer.</p> <p>Development of a scintillation...

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Bibliographic Details
Main Author: Muller, David Eugene
Format: Others
Published: 1951
Online Access:https://thesis.library.caltech.edu/10476/2/Muller_DE_1951.pdf
Muller, David Eugene (1951) A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/SB6A-0Z19. https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639 <https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639>

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https://thesis.library.caltech.edu/10476/2/Muller_DE_1951.pdf
Muller, David Eugene (1951) A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/SB6A-0Z19. https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639 <https://resolver.caltech.edu/CaltechTHESIS:10022017-160139639>

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