A Precision Measurement of the Wavelengths of Gamma and X-Radiation Following Decay of Iridium 192 and Tungsten 187, by Means of the Focusing Crystal Diffraction Spectrometer
<p>Precision determinations of gamma ray and x-ray wavelengths in the spectra following decay of iridium 192 and tungsten 187 are recorded. Measurements of these wavelengths were made with the focusing crystal diffraction spectrometer.</p> <p>Development of a scintillation...
| Summary: | <p>Precision determinations of gamma ray and x-ray wavelengths
in the spectra following decay of iridium 192 and tungsten 187 are
recorded. Measurements of these wavelengths were made with the
focusing crystal diffraction spectrometer.</p>
<p>Development of a scintillation counter for use as a
gamma ray detector in the spectrometer is described.</p>
<p>The precision of measurements with spectrometer is analyzed;
particular attention being paid to errors resulting from
statistical variations in counting rate. Linearity of the instrument
is studied by comparing measurements obtained with first, second and
third order reflections in the crystal.</p>
<p>Gamma ray energies are combined so as to form decay schemes
for iridium 192 and tungsten 187.</p> |
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