A methodology for characterizing and introducing MOSFET imperfections in analog top-down synthesis and bottom-up validation
State-of-the art electronic systems include ever more features and gather mixed-signal subsystems, possibly from different physical domains. At the same time, cost and development time are reduced; stressing the need for an efficient design flow for fast and reliable design. The present thesis contr...
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| Format: | Others |
| Language: | en |
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Universite catholique de Louvain
2005
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| Online Access: | http://edoc.bib.ucl.ac.be:81/ETD-db/collection/available/BelnUcetd-08302005-161547/ |