Nanomechanics with the atomic force microscope on polymer surfaces, interfaces and nano-materials

Methods based on the atomic force microscope (AFM) were implemented or developed to measure and map at the nanoscale the mechanical properties of polymer surfaces and of nanomaterials: force spectroscopy, force modulation, phase detection in intermittent-contact mode. Especially, a technique, referr...

Full description

Bibliographic Details
Main Author: Nysten, Bernard
Format: Others
Language:en
Published: Universite catholique de Louvain 2007
Subjects:
Online Access:http://edoc.bib.ucl.ac.be:81/ETD-db/collection/available/BelnUcetd-05032007-185509/