Advanced Data Analysis Tools and Multi-Instrument Material Characterization

Advanced Data Analysis Tools and Multi-Instrument Material Characterization

My dissertation focuses on (i) the development of new analysis tools and methodologies for analyzing X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) data, and (ii) the comprehensive characterization of materials (nanodiamonds) using a multi-instru...

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Bibliographic Details
Main Author: Singh, Bhupinder
Format: Others
Published: BYU ScholarsArchive 2015
Subjects:
XPS
ToF-SIMS
equivalent width
autocorrelation width
uniqueness plot
information content
multi-instrument material characterization
Chemistry
Online Access:https://scholarsarchive.byu.edu/etd/6168
https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=7168&context=etd

Internet

https://scholarsarchive.byu.edu/etd/6168
https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=7168&context=etd

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