SEU-Induced Persistent Error Propagation in FPGAs

SEU-Induced Persistent Error Propagation in FPGAs

This thesis introduces a new way to characterize the dynamic SEU cross section of an FPGA design in terms of its persistent and non-persistent components. An SEU in the persistent cross section results in a permanent interruption of service until reset. An SEU in the non-persistent cross section cau...

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Bibliographic Details
Main Author: Morgan, Keith S.
Format: Others
Published: BYU ScholarsArchive 2006
Subjects:
SEU
FPGA
persistence
error propagation
simulator
proton accelerator
radiation
dynamic testing
Electrical and Computer Engineering
Online Access:https://scholarsarchive.byu.edu/etd/521
https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=1520&context=etd

Internet

https://scholarsarchive.byu.edu/etd/521
https://scholarsarchive.byu.edu/cgi/viewcontent.cgi?article=1520&context=etd

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