Technique for Efficient Evaluation of SRAM Timing Failure

This brief presents a technique to evaluate the timing variation of static random access memory (SRAM). Specifically, a method called loop flattening, which reduces the evaluation of the timing statistics in the complex highly structured circuit to that of a single chain of component circuits, is ju...

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Bibliographic Details
Main Authors: Qazi, Masood (Contributor), Tikekar, Mehul (Contributor), Dolecek, Lara (Author), Shah, Devavrat (Contributor), Chandrakasan, Anantha P. (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2015-02-06T16:31:23Z.
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