Microgeometry capture using an elastomeric sensor

Microgeometry capture using an elastomeric sensor

We describe a system for capturing microscopic surface geometry. The system extends the retrographic sensor [Johnson and Adelson 2009] to the microscopic domain, demonstrating spatial resolution as small as 2 microns. In contrast to existing microgeometry capture techniques, the system is not affect...

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Bibliographic Details
Main Authors: Johnson, Micah K. (Contributor), Cole, Forrester (Contributor), Raj, Alvin (Contributor), Adelson, Edward H. (Contributor)
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory (Contributor), Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences (Contributor)
Format: Article
Language:English
Published: Association for Computing Machinery (ACM), 2014-04-14T12:48:54Z.
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