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85960 |
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|a Berggren, Karl K.
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|a Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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|a Massachusetts Institute of Technology. Research Laboratory of Electronics
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|a Berggren, Karl K.
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|a Hortensius, H. L.
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|a Driessen, E. F. C.
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|a Klapwijk, T. M.
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|a Clem, John R.
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|a Critical-current reduction in thin superconducting wires due to current crowding
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|b American Institute of Physics (AIP),
|c 2014-03-28T17:33:19Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/85960
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|a We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The results are relevant for single-photon detectors as well as parametric amplifiers.
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|a National Science Foundation (U.S.) (ECCS-0823778)
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|a United States. Dept. of Energy. Office of Basic Energy Sciences (Division of Materials Science and Engineering)
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|a en_US
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|a Article
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|t Applied Physics Letter
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