Critical-current reduction in thin superconducting wires due to current crowding

Critical-current reduction in thin superconducting wires due to current crowding

We demonstrate experimentally that the critical current in superconducting NbTiN wires is dependent on their geometrical shape, due to current-crowding effects. Geometric patterns such as 90˚ corners and sudden expansions of wire width are shown to result in the reduction of critical currents. The r...

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Bibliographic Details
Main Authors: Berggren, Karl K. (Contributor), Hortensius, H. L. (Author), Driessen, E. F. C. (Author), Klapwijk, T. M. (Author), Clem, John R. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2014-03-28T17:33:19Z.
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