Stress and temperature coupling effects on dislocation density reduction in multicrystalline silicon

In multicrystalline silicon (mc-Si), the presence of dislocation-rich areas limits solar cell conversion efficiencies. Previous studies have demonstrated that dislocation densities higher than 106 cm-2 can dramatically decrease the minority carrier lifetime. High dislocation densities, and their dec...

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Bibliographic Details
Main Authors: Castellanos, Sergio (Contributor), Bertoni, Mariana I. (Contributor), Vogl, Michelle (Contributor), Fecych, Alexandria (Contributor), Buonassisi, Tonio (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers, 2013-04-03T21:02:15Z.
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