Direct observation of spin-polarized surface states in the parent compound of a topological insulator using spin- and angle-resolved photoemission spectroscopy in a Mott-polarimetry mode

Direct observation of spin-polarized surface states in the parent compound of a topological insulator using spin- and angle-resolved photoemission spectroscopy in a Mott-polarimetry mode

We report high-resolution spin-resolved photoemission spectroscopy (spin-ARPES) measurements on the parent compound Sb of the recently discovered three-dimensional topological insulator Bi1−xSbx (Hsieh et al 2008 Nature 452 970, Hsieh et al 2009 Science 323 919). By modulating the incident photon en...

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Bibliographic Details
Main Authors: Hsieh, David (Contributor), Wray, L. (Author), Qian, D. (Author), Xia, Y. (Author), Dil, J. H. (Author), Meier, F. (Author), Patthey, L. (Author), Osterwalder, J. (Author), Bihlmayer, G. (Author), Hor, Y. S. (Author), Cava, R. J. (Author), Hasan, M. Z. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Physics (Contributor)
Format: Article
Language:English
Published: Institute of Physics Publishing, 2012-05-14T19:29:36Z.
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