Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2CuO4 [Bi subscript 2 CuO subscript 4], CuGeO3...

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Main Authors: Kim, Jungho (Author), Ellis, D. S. (Author), Zhang, H. (Author), Kim, Young-June (Author), Hill, J. P. (Author), Gog, T. (Author), Casa, D. (Author)
Other Authors: MIT Materials Research Laboratory (Contributor), Chou, Fangcheng (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2011-08-05T19:23:37Z.
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