Back-to-Basics tutorial: X-ray diffraction of thin films
Abstract X-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well as the interpretation of the resultant patterns...
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Springer US,
2022-06-21T13:00:31Z.
|
| Subjects: | |
| Online Access: | Get fulltext |