The Sliding-Aperture Transform and Its Applicability to Deep-Level Transient Spectroscopy
A mathematical method is presented for the extraction of defect parameters from the multiexponential decays generated during deep-level transient spectroscopy experiments. Such transient phenomenon results from the ionization of charge trapped in defects located in the depletion width of a semicondu...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Multidisciplinary Digital Publishing Institute,
2022-05-27T15:42:20Z.
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| Subjects: | |
| Online Access: | Get fulltext |