Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors

Bibliographic Details
Main Authors: Turchetti, Marco (Author), Bionta, Mina R (Author), Yang, Yujia (Author), Ritzkowsky, Felix (Author), Candido, Denis R (Author), Flatté, Michael E (Author), Berggren, Karl K (Author), Keathley, Phillip D (Author)
Format: Article
Language:English
Published: The Optical Society, 2022-05-26T18:07:31Z.
Subjects:
Online Access:Get fulltext
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100 1 0 |a Turchetti, Marco  |e author 
700 1 0 |a Bionta, Mina R  |e author 
700 1 0 |a Yang, Yujia  |e author 
700 1 0 |a Ritzkowsky, Felix  |e author 
700 1 0 |a Candido, Denis R  |e author 
700 1 0 |a Flatté, Michael E  |e author 
700 1 0 |a Berggren, Karl K  |e author 
700 1 0 |a Keathley, Phillip D  |e author 
245 0 0 |a Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors 
260 |b The Optical Society,   |c 2022-05-26T18:07:31Z. 
856 |z Get fulltext  |u https://hdl.handle.net/1721.1/142778 
546 |a en 
655 7 |a Article 
773 |t 10.1364/JOSAB.413680 
773 |t Journal of the Optical Society of America B: Optical Physics