Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors

Impact of DC bias on weak optical-field-driven electron emission in nano-vacuum-gap detectors

Bibliographic Details
Main Authors: Turchetti, Marco (Author), Bionta, Mina R (Author), Yang, Yujia (Author), Ritzkowsky, Felix (Author), Candido, Denis R (Author), Flatté, Michael E (Author), Berggren, Karl K (Author), Keathley, Phillip D (Author)
Format: Article
Language:English
Published: The Optical Society, 2022-05-26T18:07:31Z.
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