Accurate and Efficient Dynamic Simulations of Ferroelectric Based Electron Devices
In recent years electron devices based on ferroelectric materials have attracted a lot of interest well beyond FeRAM memories. Negative capacitance transistors (NC-FETs) have been investigated as steep slope transistors [1], [2], and Ferroelectric FETs (Fe-FETs) are under intense scrutiny also as sy...
Main Authors: | Rollo, T. (Author), Daniel, Luca (Contributor), Esseni, D. (Author) |
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Other Authors: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor) |
Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers (IEEE),
2021-06-15T20:02:16Z.
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Subjects: | |
Online Access: | Get fulltext |
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