Accurate and Efficient Dynamic Simulations of Ferroelectric Based Electron Devices

In recent years electron devices based on ferroelectric materials have attracted a lot of interest well beyond FeRAM memories. Negative capacitance transistors (NC-FETs) have been investigated as steep slope transistors [1], [2], and Ferroelectric FETs (Fe-FETs) are under intense scrutiny also as sy...

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Bibliographic Details
Main Authors: Rollo, T. (Author), Daniel, Luca (Contributor), Esseni, D. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2021-06-15T20:02:16Z.
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