Defect tolerance: fundamental limits and examples

This paper addresses the problem of adding redundancy to a collection of physical objects so that the overall system is more robust to failures. In contrast to its information counterpart, which can exploit parity to protect multiple information symbols from a single erasure, physical redundancy can...

Full description

Bibliographic Details
Main Authors: Tang, Jennifer Susan (Author), Wang, Da (Author), Polyanskiy, Yury (Author), Wornell, Gregory (Author)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2020-05-01T19:26:05Z.
Subjects:
Online Access:Get fulltext