Three-dimensional super-resolution high-throughput imaging by structured illumination STED microscopy
Stimulated emission depletion (STED) microscopy is able to image fluorescence labeled samples with nanometer scale resolution. STED microscopy is typically a point-scanning method, limited by the high intensity requirement of the depletion beam. With the development of high peak power lasers, two di...
| Main Authors: | , |
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| Other Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Optical Society of America,
2019-03-19T15:51:18Z.
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| Subjects: | |
| Online Access: | Get fulltext |