Wide-field two-photon microscopy with temporal focusing and HiLo background rejection

Scanningless depth-resolved microscopy is achieved through spatial-temporal focusing and has been demonstrated previously. The advantage of this method is that a large area may be imaged without scanning resulting in higher throughput of the imaging system. Because it is a widefield technique, the o...

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Bibliographic Details
Main Authors: Yew, Elijah Y. S. (Author), Choi, Heejin (Contributor), Kim, Daekeun (Contributor), So, Peter T. C. (Contributor)
Other Authors: Institute for Medical Engineering and Science (Contributor), Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format: Article
Language:English
Published: SPIE, 2019-03-15T14:07:09Z.
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