Origin and Control of OFF-State Leakage Current in GaN-on-Si Vertical Diodes
Conventional GaN vertical devices, though promising for high-power applications, need expensive GaN substrates. Recently, low-cost GaN-on-Si vertical diodes have been demonstrated for the first time. This paper presents a systematic study to understand and control the OFF-state leakage current in th...
Main Authors: | Hiu-Yung Wong (Author), Hatem, Christopher (Author), Lili Yu, Daniel (Author), de Braga, Nelson Almeida (Author), Mickevicius, Rimvydas Vidas (Author), Zhang, Yuhao (Contributor), Sun, Min (Contributor), Lin, Yuxuan (Contributor), Srivastava, Puneet (Contributor), Azize, Mohamed (Contributor), Piedra, Daniel (Contributor), Sumitomo, Takamichi (Contributor), Palacios, Tomas (Contributor) |
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Other Authors: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Microsystems Technology Laboratories (Contributor) |
Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers (IEEE),
2017-04-20T17:11:32Z.
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Subjects: | |
Online Access: | Get fulltext |
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