Waveguide-coupled detector in zero-change complementary metal-oxide-semiconductor

We report a waveguide-coupled photodetector realized in a standard CMOS foundry without requiring changes to the process flow (zero-change CMOS). The photodetector exploits carrier generation in the silicon-germanium normally utilized as stressor in pFETs. The measured responsivity and 3 dB bandwidt...

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Bibliographic Details
Main Authors: Alloatti, Luca (Contributor), Srinivasan, Srinivasan A. (Contributor), Orcutt, Jason Scott (Contributor), Ram, Rajeev J. (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: 2016-01-27T17:09:21Z.
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Online Access:Get fulltext
LEADER 01766 am a22002773u 4500
001 101002
042 |a dc 
100 1 0 |a Alloatti, Luca  |e author 
100 1 0 |a Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science  |e contributor 
100 1 0 |a Massachusetts Institute of Technology. Research Laboratory of Electronics  |e contributor 
100 1 0 |a Alloatti, Luca  |e contributor 
100 1 0 |a Srinivasan, Srinivasan A.  |e contributor 
100 1 0 |a Orcutt, Jason Scott  |e contributor 
100 1 0 |a Ram, Rajeev J.  |e contributor 
700 1 0 |a Srinivasan, Srinivasan A.  |e author 
700 1 0 |a Orcutt, Jason Scott  |e author 
700 1 0 |a Ram, Rajeev J.  |e author 
245 0 0 |a Waveguide-coupled detector in zero-change complementary metal-oxide-semiconductor 
260 |c 2016-01-27T17:09:21Z. 
856 |z Get fulltext  |u http://hdl.handle.net/1721.1/101002 
520 |a We report a waveguide-coupled photodetector realized in a standard CMOS foundry without requiring changes to the process flow (zero-change CMOS). The photodetector exploits carrier generation in the silicon-germanium normally utilized as stressor in pFETs. The measured responsivity and 3 dB bandwidth are of 0.023 A/W at a wavelength of 1180 nm and 32 GHz at −1 V bias (18 GHz at 0 V bias). The dark current is less than 10 pA and the dynamic range is larger than 60 dB. 
520 |a United States. Defense Advanced Research Projects Agency. Photonically Optimized Embedded Microprocessors Program (Award HR0011-11-C-0100) 
520 |a United States. Defense Advanced Research Projects Agency. Photonically Optimized Embedded Microprocessors Program (Contract HR0011-11-9-0009) 
546 |a en_US 
655 7 |a Article 
773 |t Applied Physics Letters