Maximum-likelihood decoding of device-specific multi-bit symbols for reliable key generation

Maximum-likelihood decoding of device-specific multi-bit symbols for reliable key generation

We present a PUF key generation scheme that uses the provably optimal method of maximum-likelihood (ML) detection on symbols derived from PUF response bits. Each device forms a noisy, device-specific symbol constellation, based on manufacturing variation. Each detected symbol is a letter in a codewo...

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Bibliographic Details
Main Authors: Yu, Meng-Day (Contributor), Hiller, Matthias (Author), Devadas, Srinivas (Contributor)
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory (Contributor), Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2015-11-23T17:54:47Z.
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