NBTI effects on circuit reliability performance of 4-bit Johnson counter based on different simulation configuration / M. F. Zainudin ...[et al.]
Negative-bias temperature instability (NBTI) has become a serious circuit reliability concern as technology nodes decrease to nanometer scales. This paper presents comprehensive analyses of the NBTI effect on 4-bit Johnson Counter with a 16- nm High Performance (HP) Predictive Technology Model (PTM)...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
UiTM Press,
2018-06.
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| Subjects: | |
| Online Access: | Get fulltext View Fulltext in UiTM IR |