Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design

Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design

Abstract The dimension of transistors shrinks with each new technology developed in the semiconductor industry. The extreme scaling of transistors introduces important statistical variations in their process parameters. A large digital integrated circuit consists of a very large number (in millions...

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Bibliographic Details
Main Authors: Anuj K. Tyagi, Xavier Jonsson, Theo G. J. Beelen, Wil H. A. Schilders
Format: Article
Language:English
Published: SpringerOpen 2018-10-01
Series:Journal of Mathematics in Industry
Subjects:
Yield
Failure probability
Monte Carlo
Hybrid importance sampling Monte Carlo
Dimension reduction
Exploration phase
Online Access:http://link.springer.com/article/10.1186/s13362-018-0053-4

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http://link.springer.com/article/10.1186/s13362-018-0053-4

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