Limit behavior of an oscillating thin layer
We study the limit behavior of a thermal problem, of a containing structure, an oscillating thin layer of thickness and conductivity depending of $varepsilon$. We use the the epi-convergence method to find the limit problems with interface conditions. The obtained results are tested numerically.
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Texas State University
2006-09-01
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| Series: | Electronic Journal of Differential Equations |
| Subjects: | |
| Online Access: | http://ejde.math.txstate.edu/conf-proc/14/a3/abstr.html |