Comparison of MOCVD and MBE Regrowth for CAVET Fabrication

In this paper, we demonstrate the fabrication of current aperture vertical electron transistors (CAVET) realized with two different epitaxial growth methods. Templates with a p-GaN current blocking layer (CBL) were deposited by metal organic chemical vapor deposition (MOCVD). Channel and barrier lay...

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Bibliographic Details
Main Authors: Simon Kotzea, Wiebke Witte, Birte-Julia Godejohann, Mathias Marx, Michael Heuken, Holger Kalisch, Rolf Aidam, Andrei Vescan
Format: Article
Language:English
Published: MDPI AG 2019-03-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/8/4/377