State of the Art of X-ray Speckle-Based Phase-Contrast and Dark-Field Imaging
In the past few years, X-ray phase-contrast and dark-field imaging have evolved to be invaluable tools for non-destructive sample visualisation, delivering information inaccessible by conventional absorption imaging. X-ray phase-sensing techniques are furthermore increasingly used for at-wavelength...
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| Format: | Article |
| Language: | English |
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MDPI AG
2018-04-01
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| Series: | Journal of Imaging |
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| Online Access: | http://www.mdpi.com/2313-433X/4/5/60 |