Architecture and Process Integration Overview of 3D NAND Flash Technologies
In the past few decades, NAND flash memory has been one of the most successful nonvolatile storage technologies, and it is commonly used in electronic devices because of its high scalability and reliable switching properties. To overcome the scaling limit of planar NAND flash arrays, various three-d...
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doaj-fd1e5579bf9e450cbf52874a607ffb532021-08-06T15:18:24ZengMDPI AGApplied Sciences2076-34172021-07-01116703670310.3390/app11156703Architecture and Process Integration Overview of 3D NAND Flash TechnologiesGeun Ho Lee0Sungmin Hwang1Junsu Yu2Hyungjin Kim3Department of Electronic Engineering, Inha University, Incheon 22212, KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul 08826, KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul 08826, KoreaDepartment of Electronic Engineering, Inha University, Incheon 22212, KoreaIn the past few decades, NAND flash memory has been one of the most successful nonvolatile storage technologies, and it is commonly used in electronic devices because of its high scalability and reliable switching properties. To overcome the scaling limit of planar NAND flash arrays, various three-dimensional (3D) architectures of NAND flash memory and their process integration methods have been investigated in both industry and academia and adopted in commercial mass production. In this paper, 3D NAND flash technologies are reviewed in terms of their architecture and fabrication methods, and the advantages and disadvantages of the architectures are compared.https://www.mdpi.com/2076-3417/11/15/6703NAND flash memorythree-dimensional architectureprocess integration |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Geun Ho Lee Sungmin Hwang Junsu Yu Hyungjin Kim |
spellingShingle |
Geun Ho Lee Sungmin Hwang Junsu Yu Hyungjin Kim Architecture and Process Integration Overview of 3D NAND Flash Technologies Applied Sciences NAND flash memory three-dimensional architecture process integration |
author_facet |
Geun Ho Lee Sungmin Hwang Junsu Yu Hyungjin Kim |
author_sort |
Geun Ho Lee |
title |
Architecture and Process Integration Overview of 3D NAND Flash Technologies |
title_short |
Architecture and Process Integration Overview of 3D NAND Flash Technologies |
title_full |
Architecture and Process Integration Overview of 3D NAND Flash Technologies |
title_fullStr |
Architecture and Process Integration Overview of 3D NAND Flash Technologies |
title_full_unstemmed |
Architecture and Process Integration Overview of 3D NAND Flash Technologies |
title_sort |
architecture and process integration overview of 3d nand flash technologies |
publisher |
MDPI AG |
series |
Applied Sciences |
issn |
2076-3417 |
publishDate |
2021-07-01 |
description |
In the past few decades, NAND flash memory has been one of the most successful nonvolatile storage technologies, and it is commonly used in electronic devices because of its high scalability and reliable switching properties. To overcome the scaling limit of planar NAND flash arrays, various three-dimensional (3D) architectures of NAND flash memory and their process integration methods have been investigated in both industry and academia and adopted in commercial mass production. In this paper, 3D NAND flash technologies are reviewed in terms of their architecture and fabrication methods, and the advantages and disadvantages of the architectures are compared. |
topic |
NAND flash memory three-dimensional architecture process integration |
url |
https://www.mdpi.com/2076-3417/11/15/6703 |
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1721219060434206720 |