Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts

Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts

We report on the electronic transport through nanoscopic metallic contacts under the influence of external light fields. Various processes can be of relevance here, whose underlying mechanisms can be studied by comparing different kinds of atomic contacts. For this purpose two kinds of contacts, whi...

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Bibliographic Details
Main Authors: Bastian Kopp, Zhiwei Yi, Daniel Benner, Fang-Qing Xie, Christian Obermair, Thomas Schimmel, Johannes Boneberg, Paul Leiderer, Elke Scheer
Format: Article
Language:English
Published: Beilstein-Institut 2012-10-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atom transistor
atomic contacts
cyclic voltammogram
electrochemically closed break junction
electronic transport
(Helmholtz) double layer
light-induced signals
temperature-induced changes
thermovoltage
Online Access:https://doi.org/10.3762/bjnano.3.80

Internet

https://doi.org/10.3762/bjnano.3.80

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