Contrast Transfer Function-Based Exit-Wave Reconstruction and Denoising of Atomic-Resolution Transmission Electron Microscopy Images of Graphene and Cu Single Atom Substitutions by Deep Learning Framework

Contrast Transfer Function-Based Exit-Wave Reconstruction and Denoising of Atomic-Resolution Transmission Electron Microscopy Images of Graphene and Cu Single Atom Substitutions by Deep Learning Framework

The exit wave is the state of a uniform plane incident electron wave exiting immediately after passing through a specimen and before the atomic-resolution transmission electron microscopy (ARTEM) image is modified by the aberration of the optical system and the incoherence effect of the electron. Al...

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Bibliographic Details
Main Authors: Jongyeong Lee, Yeongdong Lee, Jaemin Kim, Zonghoon Lee
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Nanomaterials
Subjects:
deep learning
exit-wave reconstruction
denoising
single atom substitution
graphene
atomic resolution transmission electron microscopy
Online Access:https://www.mdpi.com/2079-4991/10/10/1977

Internet

https://www.mdpi.com/2079-4991/10/10/1977

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