Peculiarities of electronic structure and composition in ultrasound milled silicon nanowires

Peculiarities of electronic structure and composition in ultrasound milled silicon nanowires

The combined X-ray absorption and emission spectroscopy approach was applied for the detailed electronic structure and composition studies of silicon nanoparticles produced by the ultrasound milling of heavily and lowly doped Si nanowires formed by metal-assisted wet chemical etching. The ultrasoft...

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Bibliographic Details
Main Authors: E.V. Parinova, A.K. Pisliaruk, A. Schleusener, D.A. Koyuda, R.G. Chumakov, A.M. Lebedev, R. Ovsyannikov, A. Makarova, D. Smirnov, V. Sivakov, S.Yu. Turishchev
Format: Article
Language:English
Published: Elsevier 2020-12-01
Series:Results in Physics
Subjects:
Silicon
Nanoparticles
Suboxide
Ultrasoft X-ray spectroscopy
Synchrotron radiation
Electronic structure and composition
Online Access:http://www.sciencedirect.com/science/article/pii/S221137972031799X

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http://www.sciencedirect.com/science/article/pii/S221137972031799X

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