Analyzing oxygen and silicon incorporation in GaN microstructures composed of c-planes and angled facets by confocal magneto-photoluminescence microscopy
Unintentionally doped impurities formed in the microstructures of free-standing GaN grown with facets were studied using confocal magneto-photoluminescence (PL) microscopy. Donor-bound exciton related peaks in PL spectra and their magnetic behavior allowed us to distinguish typical donor impurity at...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2020-03-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5144549 |