Humidity Effect on Chip Capacitors With Al2O3 Multistage Anodised Films
In this paper the properties of capacitors with porous-barrier and barrier-type Al2O3 layers under humidity tests are described and compared. The capacitance, conductance and dissipation factor of these structures were measured as a function of relative humidity ranging from 11% RH to 94% RH. It has...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
1992-01-01
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| Series: | Active and Passive Electronic Components |
| Subjects: | |
| Online Access: | http://dx.doi.org/10.1155/1992/63504 |