Methods for latent image simulations in photolithography with a polychromatic light attenuation equation for fabricating VIAs in 2.5D and 3D advanced packaging architectures

Abstract As demand accelerates for multifunctional devices with a small footprint and minimal power consumption, 2.5D and 3D advanced packaging architectures have emerged as an essential solution that use through-substrate vias (TSVs) as vertical interconnects. Vertical stacking enables chip package...

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Bibliographic Details
Main Authors: Daniel C. Smallwood, Paul McCloskey, Cian O’Mathuna, Declan P. Casey, James F. Rohan
Format: Article
Language:English
Published: Nature Publishing Group 2021-05-01
Series:Microsystems & Nanoengineering
Online Access:https://doi.org/10.1038/s41378-021-00266-x