High-Pressure Behaviors of Ag<sub>2</sub>S Nanosheets: An in Situ High-Pressure X-Ray Diffraction Research

An in situ high-pressure X-ray diffraction study was performed on Ag<sub>2</sub>S nanosheets, with an average lateral size of 29 nm and a relatively thin thickness. Based on the experimental data, we demonstrated that under high pressure, the samples experienced two different high-pressu...

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Bibliographic Details
Main Authors: Ran Liu, Bo Liu, Quan-Jun Li, Bing-Bing Liu
Format: Article
Language:English
Published: MDPI AG 2020-08-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/10/9/1640