Diallel-cross analysis of grain yield and stress tolerance-related traits under semi-arid conditions in Durum wheat (Triticum durum Desf.)
Half-diallel analysis with six genotypes of durum wheat was conducted for grain yield, yield components and agronomictraits related to abiotic stress tolerance. Aim of this study is to identify best parents for hybridization. Cultivar GuemgoumRkhem proved to be best general combiner for number of da...
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| Format: | Article |
| Language: | English |
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Indian Society of Plant Breeders
2013-03-01
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| Series: | Electronic Journal of Plant Breeding |
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| Online Access: | https://sites.google.com/site/ejpb2011/vol-4-1/EJPB_V4_N1_1027_1033.pdf?attredirects=0 |