Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

Abstract A combination of in situ electrical and grazing-incidence X-ray diffraction (GIXD) is a powerful tool for studies of correlations between the microstructure and charge transport in thin organic films. The information provided by such experimental approach can help optimizing the performance...

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Bibliographic Details
Main Authors: Eduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, Daniel Wesner, Alexander I. Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko, Dimitri A. Ivanov, Ullrich Pietsch, Souren Grigorian
Format: Article
Language:English
Published: SpringerOpen 2019-05-01
Series:Nanoscale Research Letters
Subjects:
Thin films
Interfacial monolayers
Oligomers
Quarterthiophenes
In situ GIXD
Phase transitions
Online Access:http://link.springer.com/article/10.1186/s11671-019-3009-8

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http://link.springer.com/article/10.1186/s11671-019-3009-8

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