Reducing Interface Traps with High Density Hydrogen Treatment to Increase Passivated Emitter Rear Contact Cell Efficiency

Abstract In this work, a high-density hydrogen (HDH) treatment is proposed to reduce interface traps and enhance the efficiency of the passivated emitter rear contact (PERC) device. The hydrogen gas is compressed at pressure (~ 70 atm) and relatively low temperature (~ 200 °C) to reduce interface tr...

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Bibliographic Details
Main Authors: Chih-Cheng Yang, Po-Hsun Chen, Ting-Chang Chang, Wan-Ching Su, Sung-Yu Chen, Shui-Chin Liu, Sheng-Yao Chou, Yung-Fang Tan, Chun-Chu Lin, Pei-Yu Wu, Tsung-Ming Tsai, Hui-Chun Huang
Format: Article
Language:English
Published: SpringerOpen 2019-12-01
Series:Nanoscale Research Letters
Subjects:
SiN
Online Access:https://doi.org/10.1186/s11671-019-3216-3