Current measurements in the intermittent-contact mode of atomic force microscopy using the Fourier method: a feasibility analysis
Atomic force microscopy (AFM) is an important tool for measuring a variety of nanoscale surface properties, such as topography, viscoelasticity, electrical potential and conductivity. Some of these properties are measured using contact methods (static contact or intermittent contact), while others a...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2020-03-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.11.37 |