An In Situ Reflectance Spectroscopic Investigation to Monitor Two-Dimensional MoS<sub>2</sub> Flakes on a Sapphire Substrate

An In Situ Reflectance Spectroscopic Investigation to Monitor Two-Dimensional MoS<sub>2</sub> Flakes on a Sapphire Substrate

In this work, we demonstrate the application of differential reflectance spectroscopy (DRS) to monitor the growth of molybdenum disulfide (MoS<sub>2</sub>) using chemical vapor deposition (CVD). The growth process, optical properties, and structure evolution of MoS<sub>2</sub>...

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Bibliographic Details
Main Authors: Yina Wang, Lei Zhang, Wen Yang, Shanshan Lv, Chenhui Su, Hang Xiao, Faye Zhang, Qingmei Sui, Lei Jia, Mingshun Jiang
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Materials
Subjects:
differential reflectance spectroscopy (DRS)
in situ
molybdenum disulfide (MoS<sub>2</sub>)
sapphire substrate
chemical vapor deposition (CVD)
Online Access:https://www.mdpi.com/1996-1944/13/24/5794

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https://www.mdpi.com/1996-1944/13/24/5794

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