A High-Efficiency Fully Convolutional Networks for Pixel-Wise Surface Defect Detection

A High-Efficiency Fully Convolutional Networks for Pixel-Wise Surface Defect Detection

In this paper, we propose a highly efficient deep learning-based method for pixel-wise surface defect segmentation algorithm in machine vision. Our method is composed of a segmentation stage (stage 1), a detection stage (stage 2), and a matting stage (stage 3). In the segmentation stage, a lightweig...

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Bibliographic Details
Main Authors: Lingteng Qiu, Xiaojun Wu, Zhiyang Yu
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Depthwise convolution
fully convolutional networks
surface defect segmentation
machine vision
Online Access:https://ieeexplore.ieee.org/document/8624360/

Internet

https://ieeexplore.ieee.org/document/8624360/

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