Symbolic Analysis of Faulty Logic Circuits under Correlated Data-Dependent Gate Failures
In this paper we present a method for symbolic analysis of unreliable logic circuits in the presence of correlated and data-dependent gate failures, described by Markov chains. Furthermore, using this method we investigate the influence of data-dependent failures on the performance of majority logi...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Telecommunications Society, Academic Mind
2014-06-01
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| Series: | Telfor Journal |
| Subjects: | |
| Online Access: |
http://journal.telfor.rs/Published/Vol6No1/Vol6No1_A1.pdf
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