Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the...

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Main Authors: Fangzhou Xia, Chen Yang, Yi Wang, Kamal Youcef-Toumi, Christoph Reuter, Tzvetan Ivanov, Mathias Holz, Ivo W. Rangelow
Format: Article
Language:English
Published: MDPI AG 2019-07-01
Series:Nanomaterials
Subjects:
Online Access:https://www.mdpi.com/2079-4991/9/7/1013
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spelling doaj-efa99da9f0974b23958dbbede89a26502020-11-25T02:34:41ZengMDPI AGNanomaterials2079-49912019-07-0197101310.3390/nano9071013nano9071013Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever ProbesFangzhou Xia0Chen Yang1Yi Wang2Kamal Youcef-Toumi3Christoph Reuter4Tzvetan Ivanov5Mathias Holz6Ivo W. Rangelow7Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USANano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyAtomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due to multiple different refraction indices of materials. Spurious structure resonance can be excited from piezo actuator excitation. Photothermal actuation resolves the resonance confusion but makes optical setup more complicated. In this paper, we present the design and fabrication method of coated active scanning probes with piezoresistive deflection sensing, thermomechanical actuation and thin photoresist polymer surface coating. The newly developed probes are capable of conducting topography imaging in opaque liquids without the need of an optical system. The selected coating can withstand harsh chemical environments with high acidity (e.g., 35% sulfuric acid). The probes are operated in various opaque liquid environments with a custom designed AFM system to demonstrate the imaging performance. The development of coated active probes opens up possibilities for observing samples in their native environments.https://www.mdpi.com/2079-4991/9/7/1013atomic force microscopeactive cantilever probecoatingthermomechanical actuationpiezo-resistive sensingnano-positionerdigital lock-in amplifiertopography imaging
collection DOAJ
language English
format Article
sources DOAJ
author Fangzhou Xia
Chen Yang
Yi Wang
Kamal Youcef-Toumi
Christoph Reuter
Tzvetan Ivanov
Mathias Holz
Ivo W. Rangelow
spellingShingle Fangzhou Xia
Chen Yang
Yi Wang
Kamal Youcef-Toumi
Christoph Reuter
Tzvetan Ivanov
Mathias Holz
Ivo W. Rangelow
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
Nanomaterials
atomic force microscope
active cantilever probe
coating
thermomechanical actuation
piezo-resistive sensing
nano-positioner
digital lock-in amplifier
topography imaging
author_facet Fangzhou Xia
Chen Yang
Yi Wang
Kamal Youcef-Toumi
Christoph Reuter
Tzvetan Ivanov
Mathias Holz
Ivo W. Rangelow
author_sort Fangzhou Xia
title Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
title_short Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
title_full Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
title_fullStr Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
title_full_unstemmed Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
title_sort lights out! nano-scale topography imaging of sample surface in opaque liquid environments with coated active cantilever probes
publisher MDPI AG
series Nanomaterials
issn 2079-4991
publishDate 2019-07-01
description Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due to multiple different refraction indices of materials. Spurious structure resonance can be excited from piezo actuator excitation. Photothermal actuation resolves the resonance confusion but makes optical setup more complicated. In this paper, we present the design and fabrication method of coated active scanning probes with piezoresistive deflection sensing, thermomechanical actuation and thin photoresist polymer surface coating. The newly developed probes are capable of conducting topography imaging in opaque liquids without the need of an optical system. The selected coating can withstand harsh chemical environments with high acidity (e.g., 35% sulfuric acid). The probes are operated in various opaque liquid environments with a custom designed AFM system to demonstrate the imaging performance. The development of coated active probes opens up possibilities for observing samples in their native environments.
topic atomic force microscope
active cantilever probe
coating
thermomechanical actuation
piezo-resistive sensing
nano-positioner
digital lock-in amplifier
topography imaging
url https://www.mdpi.com/2079-4991/9/7/1013
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