Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes
Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the...
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doaj-efa99da9f0974b23958dbbede89a26502020-11-25T02:34:41ZengMDPI AGNanomaterials2079-49912019-07-0197101310.3390/nano9071013nano9071013Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever ProbesFangzhou Xia0Chen Yang1Yi Wang2Kamal Youcef-Toumi3Christoph Reuter4Tzvetan Ivanov5Mathias Holz6Ivo W. Rangelow7Department of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USADepartment of Mechanical Engineering, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, MA 02139, USANano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyNano analytik GmbH, Ehrenbergstraße 1, 98693 Ilmenau, GermanyAtomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due to multiple different refraction indices of materials. Spurious structure resonance can be excited from piezo actuator excitation. Photothermal actuation resolves the resonance confusion but makes optical setup more complicated. In this paper, we present the design and fabrication method of coated active scanning probes with piezoresistive deflection sensing, thermomechanical actuation and thin photoresist polymer surface coating. The newly developed probes are capable of conducting topography imaging in opaque liquids without the need of an optical system. The selected coating can withstand harsh chemical environments with high acidity (e.g., 35% sulfuric acid). The probes are operated in various opaque liquid environments with a custom designed AFM system to demonstrate the imaging performance. The development of coated active probes opens up possibilities for observing samples in their native environments.https://www.mdpi.com/2079-4991/9/7/1013atomic force microscopeactive cantilever probecoatingthermomechanical actuationpiezo-resistive sensingnano-positionerdigital lock-in amplifiertopography imaging |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Fangzhou Xia Chen Yang Yi Wang Kamal Youcef-Toumi Christoph Reuter Tzvetan Ivanov Mathias Holz Ivo W. Rangelow |
spellingShingle |
Fangzhou Xia Chen Yang Yi Wang Kamal Youcef-Toumi Christoph Reuter Tzvetan Ivanov Mathias Holz Ivo W. Rangelow Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes Nanomaterials atomic force microscope active cantilever probe coating thermomechanical actuation piezo-resistive sensing nano-positioner digital lock-in amplifier topography imaging |
author_facet |
Fangzhou Xia Chen Yang Yi Wang Kamal Youcef-Toumi Christoph Reuter Tzvetan Ivanov Mathias Holz Ivo W. Rangelow |
author_sort |
Fangzhou Xia |
title |
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes |
title_short |
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes |
title_full |
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes |
title_fullStr |
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes |
title_full_unstemmed |
Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes |
title_sort |
lights out! nano-scale topography imaging of sample surface in opaque liquid environments with coated active cantilever probes |
publisher |
MDPI AG |
series |
Nanomaterials |
issn |
2079-4991 |
publishDate |
2019-07-01 |
description |
Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the deflection of the cantilever probe. This optical method for deflection sensing limits the capability of AFM to obtaining images in transparent environments only. In addition, tapping mode imaging in liquid environments with transparent sample chamber can be difficult for laser-probe alignment due to multiple different refraction indices of materials. Spurious structure resonance can be excited from piezo actuator excitation. Photothermal actuation resolves the resonance confusion but makes optical setup more complicated. In this paper, we present the design and fabrication method of coated active scanning probes with piezoresistive deflection sensing, thermomechanical actuation and thin photoresist polymer surface coating. The newly developed probes are capable of conducting topography imaging in opaque liquids without the need of an optical system. The selected coating can withstand harsh chemical environments with high acidity (e.g., 35% sulfuric acid). The probes are operated in various opaque liquid environments with a custom designed AFM system to demonstrate the imaging performance. The development of coated active probes opens up possibilities for observing samples in their native environments. |
topic |
atomic force microscope active cantilever probe coating thermomechanical actuation piezo-resistive sensing nano-positioner digital lock-in amplifier topography imaging |
url |
https://www.mdpi.com/2079-4991/9/7/1013 |
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