Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Lights Out! Nano-Scale Topography Imaging of Sample Surface in Opaque Liquid Environments with Coated Active Cantilever Probes

Atomic force microscopy is a powerful topography imaging method used widely in nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) utilizes an optical lever system typically composed of a laser source, lenses and a four quadrant photodetector to amplify and measure the...

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Bibliographic Details
Main Authors: Fangzhou Xia, Chen Yang, Yi Wang, Kamal Youcef-Toumi, Christoph Reuter, Tzvetan Ivanov, Mathias Holz, Ivo W. Rangelow
Format: Article
Language:English
Published: MDPI AG 2019-07-01
Series:Nanomaterials
Subjects:
atomic force microscope
active cantilever probe
coating
thermomechanical actuation
piezo-resistive sensing
nano-positioner
digital lock-in amplifier
topography imaging
Online Access:https://www.mdpi.com/2079-4991/9/7/1013

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https://www.mdpi.com/2079-4991/9/7/1013

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