A New High-Throughput Focused MeV Ion-Beam Analysis Setup
The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NR...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-02-01
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| Series: | Instruments |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2410-390X/5/1/10 |