High-fidelity structured illumination microscopy by point-spread-function engineering
Abstract Structured illumination microscopy (SIM) has become a widely used tool for insight into biomedical challenges due to its rapid, long-term, and super-resolution (SR) imaging. However, artifacts that often appear in SIM images have long brought into question its fidelity, and might cause misi...
| Main Authors: | , , , , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2021-04-01
|
| Series: | Light: Science & Applications |
| Online Access: | https://doi.org/10.1038/s41377-021-00513-w |